doc. no : qw0905- rev. : a date : lue63233h/p1 data sheet lue63233h/p1 super bright round type led lamps ligitek electronics co.,ltd. property of ligitek only 04 - nov. - 2005
25.0min 0.5typ 1.5max - + 1.0min 2.54typ r2.4 4.4 0.6 5.8 4.8 directivity radiation note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. package dimensions ligitek electronics co.,ltd. property of ligitek only part no. lue63233h/p1page 1/4 -30 75% 100% -60 25%50%100% 25%0 50%75% 0 60 30
typical electrical & optical characteristics (ta=25 ) absolute maximum ratings at ta=25 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. lue63233h/p1 part no orange emitted algainp material water clear lens color symbol parameter soldering temperature storage temperature tsol tstg peak forward current duty 1/10@10khz forward current electrostatic discharge( * ) operating temperature reverse current @5v power dissipationpd esd t opr ir i f i fp part no. lue63233h/p1 viewing angle 2 1/2 (deg) 60 min. forward voltage @ ma(v) 1.7 20 618 20 spectral halfwidth nm dominant wave length dnm 700 min. 2.6 max. 1100 typ. luminous intensity @20ma(mcd) unit max 260 for 5 sec max (2mm from body) -40 ~ +100 a mw 130 -40 ~ +85 2000 10 v 50 100 ue(h) ma ma ligitek electronics co.,ltd. property of ligitek only page ratings 2/4 static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. *
fig.4 relative intensity vs. temperature 3.0 2.5 2.0 1.5 0.5 1.0 0.0 1.0 r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) 550 0.0 0.5 600650700 fig.3 forward voltage vs. temperature 0 fig.5 relative intensity vs. wavelength ambient temperature( ) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 -40 0.8 -20 1.0 0.9 1.1 1.2 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 80 40 2060100 ambient temperature( ) -20 -4020 060 4080100 3.0 2.0 1.0 1.5 2.5 fig.2 relative intensity vs. forward current typical electro-optical characteristics curve 0.5 0.0 ligitek electronics co.,ltd. property of ligitek only fig.1 forward current vs. forward voltage forward voltage(v) f o r w a r d c u r r e n t ( m a ) 1.0 0 1 1.5 10 1 100 ue(h) chip 1000 r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a 2.02.53.0 forward current(ma) 1101001000 3.5 part no. 3/4 page lue63233h/p1
mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 the purpose of this test is the resistance of the device under tropical for hous. high temperature high humidity test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.t.sol=230 5 2.dwell time=5 1sec 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.t.sol=260 5 2.dwell time= 10 1sec. solder resistance test solderability test thermal shock test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) test condition high temperature storage test low temperature storage test operating life test test item the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. description reference standard ligitek electronics co.,ltd. property of ligitek only lue63233h/p1 reliability test: part no. page 4/4
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